|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 122 of 140 found articles
| Title: |
The optimum fin width in p-MuGFETs with the consideration of NBTI and hot carrier degradation |
| Author: |
Kim, Dong Wook Park, Woo Sang Park, Jong Tae |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 9-11 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 122 of 140 found articles
| << previous | next >> |