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                                       Details for article 116 of 140 found articles
 
 
  Study of non-contact nano-probing technique using FIB
 
 
Title: Study of non-contact nano-probing technique using FIB
Author: Mashiko, Yoji
Etoh, Hiroaki
Furukawa, Akiyoshi
Nomiyama, Daisuke
Ichimaru, Osamu
Appeared in: Microelectronics reliability
Paging: Volume 50 (2010) nr. 9-11 pages 3 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 116 of 140 found articles
 
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