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                                       Details for article 115 of 140 found articles
 
 
  SPICE modelling of hot-carrier degradation in Si1– x Ge x S/D and HfSiON based pMOS transistors
 
 
Title: SPICE modelling of hot-carrier degradation in Si1– x Ge x S/D and HfSiON based pMOS transistors
Author: Martin-Martinez, J.
Amat, E.
Gonzalez, M.B.
Verheyen, P.
Rodríguez, R.
Nafría, M.
Aymerich, X.
Simoen, E.
Appeared in: Microelectronics reliability
Paging: Volume 50 (2010) nr. 9-11 pages 4 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 115 of 140 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands