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                                       Details for article 114 of 140 found articles
 
 
  Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level
 
 
Title: Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level
Author: Autran, J.L.
Munteanu, D.
Roche, P.
Gasiot, G.
Martinie, S.
Uznanski, S.
Sauze, S.
Semikh, S.
Yakushev, E.
Rozov, S.
Loaiza, P.
Warot, G.
Zampaolo, M.
Appeared in: Microelectronics reliability
Paging: Volume 50 (2010) nr. 9-11 pages 10 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 114 of 140 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands