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Journal description
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Details for article 5 of 23 found articles
| Title: |
Copper trace fatigue models for mechanical cycling, vibration and shock/drop of high-density PWAs |
| Author: |
Farley, D. Zhou, Y. Askari, F. Al-Bassyiouni, M. Dasgupta, A. Caers, J.F.J. DeVries, J.W.C. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 7 pages 11 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 23 found articles
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