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Journal description
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Details for article 14 of 22 found articles
| Title: |
Impedance and barrier capacitance of silicon diodes implanted with high-energy Xe ions |
| Author: |
Poklonski, N.A. Gorbachuk, N.I. Shpakovski, S.V. Filipenia, V.A. Lastovskii, S.B. Skuratov, V.A. Wieck, A. Markevich, V.P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 6 pages 8 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 22 found articles
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