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Journal description
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Details for article 11 of 22 found articles
| Title: |
High thermal stability AlGaAs/InGaAs enhancement-mode pHEMT using palladium-gate technology |
| Author: |
Chiu, Hsien-Chin Yang, Chih-Wei Chen, Chao-Hung Lin, Che-Kai Fu, Jeffrey S. Tu, Hsing-Yuan Tang, Shiang-Feng |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 6 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 22 found articles
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