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Journal description
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Details for article 8 of 16 found articles
| Title: |
Experimental and simulation studies of resistivity in nanoscale copper films |
| Author: |
Emre Yarimbiyik, A. Schafft, Harry A. Allen, Richard A. Vaudin, Mark D. Zaghloul, Mona E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 49 (2009) nr. 2 pages 8 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 16 found articles
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