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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 3 of 16 found articles
| Title: |
A new on-chip test structure for real time fatigue analysis in polysilicon MEMS |
| Author: |
Langfelder, G. Longoni, A. Zaraga, F. Corigliano, A. Ghisi, A. Merassi, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 49 (2009) nr. 2 pages 7 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 16 found articles
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