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Journal description
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Details for article 3 of 21 found articles
| Title: |
Bulk built in current sensors for single event transient detection in deep-submicron technologies |
| Author: |
Wirth, Gilson |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 5 pages 6 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 21 found articles
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