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Journal description
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Details for article 7 of 22 found articles
| Title: |
Conduction mechanisms of silicon oxide/titanium oxide MOS stack structures |
| Author: |
Tinoco, J.C. Estrada, M. Iñiguez, B. Cerdeira, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 3 pages 12 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 22 found articles
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