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Details for article 1 of 20 found articles
| Title: |
A 2D threshold-voltage model for small MOSFET with quantum-mechanical effects |
| Author: |
Xu, J.P. Li, Y.P. Lai, P.T. Chen, W.B. Xu, S.G. Guan, J.G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 48 (2008) nr. 1 pages 6 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 20 found articles
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