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Journal description
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Details for article 81 of 100 found articles
| Title: |
Robustness test and failure analysis of IGBT modules during turn-off |
| Author: |
Urresti-Ibañez, J. Castellazzi, A. Piton, M. Rebollo, J. Mermet-Guyennet, M. Ciappa, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 9-11 pages 5 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 81 of 100 found articles
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