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Journal description
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Details for article 47 of 100 found articles
| Title: |
Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements |
| Author: |
Gao, Y. Guitard, N. Salamero, C. Bafleur, M. Bary, L. Escotte, L. Gueulle, P. Lescouzeres, L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 9-11 pages 6 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 100 found articles
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