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Journal description
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Details for article 6 of 25 found articles
| Title: |
Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors |
| Author: |
Berechman, Ronen A. Revzin, Boris Shapira, Yoram |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 8 pages 6 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 25 found articles
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