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Journal description
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Details for article 4 of 25 found articles
| Title: |
Cohesive zone modeling for structural integrity analysis of IC interconnects |
| Author: |
van Hal, B.A.E. Peerlings, R.H.J. Geers, M.G.D. van der Sluis, O. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 8 pages 11 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 25 found articles
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