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Journal description
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Details for article 8 of 46 found articles
| Title: |
A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer |
| Author: |
Zou, X. Xu, J.P. Li, C.X. Lai, P.T. Chen, W.B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 2-3 pages 4 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 46 found articles
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