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Journal description
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All issues of the corresponding volume
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Details for article 24 of 54 found articles
| Title: |
Feature extraction and damage-precursors for prognostication of lead-free electronics |
| Author: |
Lall, Pradeep Hande, Madhura Bhat, Chandan Islam, Nokibul Suhling, Jeff Lee, Jay |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 12 pages 14 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 54 found articles
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