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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 54 found articles
| Title: |
Drop simulation/experimental verification and shock resistance improvement of TFT–LCD monitors |
| Author: |
Pan, Min-Chun Chen, Po-Chun |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 12 pages 11 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 54 found articles
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