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Journal description
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Details for article 6 of 97 found articles
| Title: |
A new high-voltage tolerant I/O for improving ESD robustness |
| Author: |
Jang, J.T. Kim, Y.C. Bong, W.H. Kwon, E.K. Kwon, B.J. Jeon, J.S. Kim, H.G. Son, I.H. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 9-11 pages 4 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 97 found articles
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