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Journal description
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Details for article 4 of 97 found articles
| Title: |
Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant |
| Author: |
Alvarez, D. Abou-Khalil, M.J. Russ, C. Chatty, K. Gauthier, R. Kontos, D. Li, J. Seguin, C. Halbach, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 9-11 pages 6 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 97 found articles
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