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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 17 of 97 found articles
| Title: |
Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node |
| Author: |
Schlangen, R. Sadewater, P. Kerst, U. Boit, C. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 9-11 pages 6 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 97 found articles
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