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Journal description
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Details for article 9 of 24 found articles
| Title: |
Evaluation of SiGe:C HBT intrinsic reliability using conventional and step stress methodologies |
| Author: |
Gaw, Craig Arnold, T. Martin, R. Zhang, L. Zupac, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 8 pages 7 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 24 found articles
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