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Journal description
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Details for article 4 of 22 found articles
| Title: |
Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures |
| Author: |
Filip, V. Wong, Hei Nicolaescu, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 7 pages 8 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 22 found articles
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