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Journal description
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Details for article 10 of 22 found articles
| Title: |
Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology |
| Author: |
Chen, Shih-Hung Ker, Ming-Dou |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 7 pages 8 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 22 found articles
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