|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 41 found articles
| Title: |
Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N |
| Author: |
Guhel, Y. Boudart, B. Delos, E. Germain, M. Bougrioua, Z. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 5-6 pages 8 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 41 found articles
| << previous | next >> |