|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 9 of 47 found articles
| Title: |
Determination of the thermal conductivity of composite low-k dielectrics for advanced interconnect structures |
| Author: |
Chen, F. Gill, J. Harmon, D. Sullivan, T. Strong, A. Li, B. Rathore, H. Edelstein, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 2-4 pages 12 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 47 found articles
| << previous | next >> |