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Journal description
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Details for article 25 of 26 found articles
| Title: |
Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates |
| Author: |
Sedaghat, Reza Kunchwar, Mayuri Abedi, Raha Javaheri, Reza |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 12 pages 10 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 26 found articles
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