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Journal description
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Details for article 5 of 24 found articles
| Title: |
EBSD measurements of elastic strain fields in a GaN/sapphire structure |
| Author: |
Luo, J.F. Ji, Y. Zhong, T.X. Zhang, Y.Q. Wang, J.Z. Liu, J.P. Niu, N.H. Han, J. Guo, X. Shen, G.D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 1 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 24 found articles
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