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Journal description
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Details for article 17 of 38 found articles
| Title: |
Gate dielectric breakdown in the time-scale of ESD events |
| Author: |
Weir, Bonnie E. Leung, Che-Choi Silverman, Paul J. Alam, Muhammad A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 45 (2005) nr. 3-4 pages 10 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 38 found articles
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