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                                       Details for article 24 of 25 found articles
 
 
  Test generation for technology-specific multi-faults based on detectable perturbations
 
 
Title: Test generation for technology-specific multi-faults based on detectable perturbations
Author: Zemva, Andrej
Zajc, Baldomir
Appeared in: Microelectronics reliability
Paging: Volume 45 (2005) nr. 1 pages 11 p.
Year: 2005
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 25 found articles
 
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