|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 104 found articles
| Title: |
Analysis of the layout impact on electric fields in interconnect structures using finite element method |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 9-11 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 104 found articles
| << previous | next >> |