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Journal description
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Details for article 6 of 23 found articles
| Title: |
Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET |
| Author: |
Shih, Chun-Hsing Chen, Yi-Min Lien, Chenhsin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 7 pages 7 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 23 found articles
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