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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 23 found articles
| Title: |
Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET |
| Author: |
Sozza, A Dua, C Kerlain, A Brylinski, C Zanoni, E |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 7 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 23 found articles
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