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Journal description
All volumes of the corresponding journal
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Details for article 9 of 20 found articles
| Title: |
Integrating thick copper/Black Diamond™ layer in CMOS interconnect process for RF passive components |
| Author: |
Lihui, Guo Yibin, Zhang Jeffrey, Su Yong Jie |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 4 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 20 found articles
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