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  Reliability and performance scaling of very high speed SiGe HBTs
 
 
Title: Reliability and performance scaling of very high speed SiGe HBTs
Author: Freeman, Greg
Rieh, Jae-Sung
Yang, Zhijian
Guarin, Fernando
Appeared in: Microelectronics reliability
Paging: Volume 44 (2004) nr. 3 pages 14 p.
Year: 2004
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 18 found articles
 
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