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Journal description
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Details for article 15 of 22 found articles
| Title: |
Modeling of the spectral response of PIN photodetectors Impact of exposed zone thickness, surface recombination velocity and trap concentration |
| Author: |
Bouhdada, A Marrakh, R Vigué, F Faurie, J.-P |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 2 pages 6 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 22 found articles
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