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Journal description
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Details for article 6 of 21 found articles
| Title: |
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements |
| Author: |
Kwon, Hyuck In Man Kang, In Park, Byung-Gook Duk Lee, Jong Sik Park, Sang Chak Ahn, Jung Hee Lee, Yong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 1 pages 5 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 21 found articles
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