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Journal description
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Details for article 2 of 26 found articles
| Title: |
Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC product |
| Author: |
Lin, I-Cheng Huang, Chih-Yao Chao, Chuan-Jane Ker, Ming-Dou |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 43 (2003) nr. 8 pages 7 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 26 found articles
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