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Journal description
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Details for article 7 of 20 found articles
| Title: |
Hot electron induced degradation of undoped AlGaN/GaN HFETs |
| Author: |
Kim, Hyungtak Vertiatchikh, Alexei Thompson, Richard M. Tilak, Vinayak Prunty, Thomas R. Shealy, James R. Eastman, Lester F. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 43 (2003) nr. 6 pages 5 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 20 found articles
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