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Details for article 6 of 110 found articles
| Title: |
Analysis of the effect of the gate oxide breakdown on SRAM stability |
| Author: |
Rodrı́guez, R. Stathis, J.H. Linder, B.P. Kowalczyk, S. Chuang, C.T. Joshi, R.V. Northrop, G. Bernstein, K. Bhavnagarwala, A.J. Lombardo, S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 4 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 110 found articles
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