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Journal description
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Details for article 12 of 110 found articles
| Title: |
A specimen-current branching approach for FA of long Electromigration test lines |
| Author: |
Caprile, C. De Munari, I. Improntac, M. Podda, S. Scorzoni, A. Vanzi, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 4 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 110 found articles
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