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Journal description
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Details for article 8 of 15 found articles
| Title: |
High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package |
| Author: |
Xie, Huimin Asundi, Anand Boay, Chai Gin Yunguang, Lu Yu, Jin Zhaowei, Zhong Ngoi, Bryan K.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 8 pages 9 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 15 found articles
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