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  A multiprocess performance analysis chart based on the incapability index C pp: an application to the chip resistors
 
 
Title: A multiprocess performance analysis chart based on the incapability index C pp: an application to the chip resistors
Author: Pearn, W.L
Ko, C.H
Wang, K.H
Appeared in: Microelectronics reliability
Paging: Volume 42 (2002) nr. 7 pages 5 p.
Year: 2002
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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