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Journal description
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Details for article 10 of 26 found articles
| Title: |
ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing environments |
| Author: |
Siplon, Jocelyn Ewell, Gary J. Gibson, Thomas |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 6 pages 6 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 26 found articles
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