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                                       Details for article 9 of 20 found articles
 
 
  1/f noise as a reliability indicator for subsurface Zener diodes
 
 
Title: 1/f noise as a reliability indicator for subsurface Zener diodes
Author: Zhuang, Yiqi
Du, Lei
Appeared in: Microelectronics reliability
Paging: Volume 42 (2002) nr. 3 pages 6 p.
Year: 2002
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 20 found articles
 
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