|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 20 found articles
| Title: |
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors |
| Author: |
Caddemi, A. Donato, N. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 3 pages 6 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 20 found articles
| << previous | next >> |