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Journal description
All volumes of the corresponding journal
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Details for article 13 of 20 found articles
| Title: |
MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC |
| Author: |
Chakraborty, S Lai, P.T Kwok, P.C.K |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 3 pages 4 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 20 found articles
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