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Journal description
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Details for article 11 of 20 found articles
| Title: |
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs |
| Author: |
Liou, Juin J. Shireen, R. Ortiz-Conde, A. Garcı́a Sánchez, F.J. Cerdeira, A. Gao, X. Zou, Xuecheng Ho, C.S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 3 pages 5 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 20 found articles
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