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                                       Details for article 20 of 25 found articles
 
 
  Solder joint reliability of a polymer reinforced wafer level package
 
 
Title: Solder joint reliability of a polymer reinforced wafer level package
Author: Kim, Deok-Hoon
Elenius, Peter
Johnson, Michael
Barrett, Scott
Appeared in: Microelectronics reliability
Paging: Volume 42 (2002) nr. 12 pages 12 p.
Year: 2002
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 20 of 25 found articles
 
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